Summary and Info
This text presents all the important test design techniques in a single place and in a consistent, and easy-to-digest format. It enables you to choose the best test case design, find software defects, develop optimal strategies, and more.
More About the Author
Lee G. Copeland is an American architect and urban designer. He served as Dean of the University of Washington College of Architecture and Urban Planning (now College of Built Environments) from 1972 to 1979 and thereafter as Dean of the University of Pennsylvania Graduate School of Fine Arts (now PennDesign) from 1979 to 1991. He is currently a consulting principal at Mithun.
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