Summary and Info
Advances in metrology depend upon improvements in scientific and technical knowledge and in instrumentation quality, as well as better use of advanced mathematical tools and development of new ones. In this volume, scientists from both the mathematical and the metrological fields exchange their experiences. Industrial sectors, such as instrumentation and software, should benefit from this exchange, since metrology has a high impact on the overall quality of industrial products, and applied mathematics is becoming more and more important in industrial processes. The book should be of interest to people in universities, research centres and industries who are involved in measurements and need advanced mathematical tools to solve their problems, and to those developing such mathematical tools L[superscript p] [right arrow] L[superscript q] Estimates for the Circular Maximal Function / Wilhelm Schlag -- Three Regularity Results in Harmonic Analysis / Terry Tao -- Time-Frequency Analysis in the Discrete Phase Plane / Christoph Martin Thiele -- Multiresolution Homogenization Schemes for Differential Equations and Applications / Anna C. Gilbert -- Local Feature Extraction and Its Applications Using a Library of Bases / Naoki Saito
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