Summary and Info
The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS).Content: Chapter 1 General Introduction to Transmission Electron Microscopy (TEM) (pages 1–19): Peter GoodhewChapter 2 Introduction to Electron Optics (pages 21–38): Gordon TatlockChapter 3 Development of STEM (pages 39–53): L. M. BrownChapter 4 Lens Aberrations: Diagnosis and Correction (pages 55–87): Andrew Bleloch and Quentin RamasseChapter 5 Theory and Simulations of STEM Imaging (pages 89–110): Peter D. NellistChapter 6 Details of STEM (pages 111–161): Alan CravenChapter 7 Electron Energy Loss Spectrometry and Energy Dispersive X?ray Analysis (pages 163–210): Rik Brydson and Nicole HondowChapter 8 Applications of Aberration?Corrected Scanning Transmission Electron Microscopy (pages 211–240): Mervyn D. ShannonChapter 9 Aberration?Corrected Imaging in CTEM (pages 241–261): Sarah J. Haigh and Angus I. Kirkland
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