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  • Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshop, SSPR & SPR 2008, Orlando, USA, December 4-6, 2008. Proceedings

    Tin Kam Ho (auth.) Niels da Vitoria Lobo Takis Kasparis Fabio Roli James T. Kwok Michael Georgiopoulos Georgios C. Anagnostopoulos Marco Loog (eds.)

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23 - 25Hours to read