Summary and Info
This book focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the very large scale integrated (VLSI) design flow. After a survey of existing techniques for power constrained testing of VLSI circuits, several test automation techniques are presented for reducing power in scan-based sequential circuits and BIST data paths. Nicolici is affiliated with McMaster University, Canada. Al-Hashimi is affiliated with the University of Southampton, UK.
More About the Author
Dr. Richard L. Peterson is an American behavioral economist and psychiatrist. He has developed behavioral finance-based quantitative models, imaged the brains of test subjects while play-trading, and is a writer and consultant in the psychology of financial decisions and the mining of sentiment in social media.
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